Free News Alerts by Keyword
Interested in embedded technology? Are you an engineer or designer? e-clips helps you follow the latest news on key topics like multicore, FPGAs, 8051, ESL, PC/104 and more!

e-clips news alerts by keyword

	Green Hills Software Announces Multicore TimeMachine Trace Tools for MIPS and … | ARM and Cadence Partner to Implement Industry’s First Cortex-A57… . . . last week's e-clips alert for design for test
sponsor: free technology news alerts

best websites for design-for-test:

overviews, conferences (7 records)
webinars (1 record)
newsgroups, vendors, tools... (7 records)
papers, tutorials, associations... (7 records)
books (5 records)

top ten, free stuff, & vendors for design-for-test:

e-clips "eReport: " best websites for design-for-test
design-for-test vendor guide
design-for-test services guide

Express Logic develops, markets and supports the ThreadX® real-time operating system (RTOS), NetX™TCP/IP networking stack, USBX™ USB stack, FileX® embedded file system, and PEGX™ GUI toolkit for embedded applications. ThreadX is a royalty-free, full source code, small-footprint, low-overhead RTOS that is extremely easy to learn and use. ThreadX is one of the most widely deployed RTOS products in the world, with over 1.25 billion products based on ThreadX.

Definition: Design for Test (aka 'Design for Testability' or 'DFT') is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and apply manufacturing tests for the designed hardware. The purpose of manufacturing tests is to validate that the product hardware contains no defects that could, otherwise, adversely affect the product’s correct functioning. Tests are applied at several steps in the hardware manufacturing flow and, for certain products, may also be used for hardware maintenance in the customer’s environment. The tests generally are driven by test programs that execute in Automatic Test Equipment (ATE) or, in the case of system maintenance, inside the assembled system itself. In addition to finding and indicating the presence of defects (i.e., the test fails), tests may be able to log diagnostic information about the nature of the encountered test fails. The diagnostic information can be used to locate the source of the failure. DFT plays an important role in the development of test programs and as an interface for test application and diagnostics. Automatic test pattern generation, or ATPG, is much easier if appropriate DFT rules and suggestions have been implemented. Source: Wikipedia (http://en.wikipedia.org/wiki/Design_for_test)